Method and apparatus for measuring delay time

Details Method and apparatus for measuring delay time Method and apparatus for measuring delay time

2007-07-17

2007-07-17

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

Reexamination Certificate

active

11161254

ABSTRACT:
A method and apparatus for measuring a delay time is provided. First, a plurality of first/second phase signals, a first/second standard signal, and an inverse signal of the second standard signal are generated. The inverse signal of the second standard signal is applied to a second conductive line close to at least an adjacent conductive line. The first/second standard signal is applied to the first/second conductive line to obtain a first/second transmission signal. Then, the first/second transmission signal is sequentially sampled by the first/second phase signals to sequentially obtain a plurality of first/second sampling results. The first/second sampling results are sequentially identified by a first/second identifying level to obtain a first/second identification result. Accordingly, the delay time between the first and the second transmission signal may be obtained by comparing the different the second and the first identification result.

REFERENCES:
patent: 6405350 (2002-06-01), Tawada
patent: 6925404 (2005-08-01), Corr
patent: 2005/0012508 (2005-01-01), Pandya et al.

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