Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1990-10-19
1992-06-16
Cuchlinski, Jr., William A.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
374 55, 356356, G01B 1102, G01N 2516
Patent
active
051219875
ABSTRACT:
A method and apparatus for optically measuring coefficient of thermal expansion includes an optical dilatometer system. The system provides a housing having a chamber defined therein and a transparent end adapted for receiving a focused laser beam into the chamber. The housing is adapted for maintaining a vacuum in the chamber. The optical dilatometer system further provides an interferometer comprising first and second interference surfaces, the interferometer being positioned within the chamber. The system further provides a test sample positioned between the first and second interference surfaces. The method includes the step of transmitting a focused laser beam through the transparent end and to the interferometer, thereby generating an interference pattern defined by Newton rings. The Newton ring interference pattern is utilized to determine the coefficient of thermal expansion of the test sample.
REFERENCES:
patent: 3899253 (1975-08-01), Overhoff
patent: 3913141 (1975-10-01), Collins et al.
patent: 3930730 (1976-01-01), Laurens et al.
patent: 3952150 (1976-04-01), Gerardin et al.
patent: 3953129 (1976-04-01), Hildebrand
patent: 3997266 (1976-12-01), Hildebrand
patent: 4499373 (1985-02-01), Johnston
patent: 4541717 (1985-09-01), Itamoto
patent: 4591996 (1986-05-01), Vachon
patent: 4606638 (1986-08-01), Sommargren
patent: 4641971 (1987-02-01), Korth
patent: 4729654 (1988-03-01), Akuta et al.
Bennett, S. J., "An absolute interferometric dilatometer," J. Phys. E., Sci. Instrum (GB), vol. 10, No. 5 (May 1977).
Merritt, G. E., "The Interference Method of Measuring Thermal Expansion," Research Paper No. 515, Bureau of Standards Journal of Research, vol. 10 (Jan. 1933).
Saunders, J. B., "Parallel Testing Interferometer," J. of Research of the National Bureau of Standards, vol. 61, No. 6, pp. 491-498 (Dec. 1958).
Tanner, L. H. "The Measurement of Viscosity by Optical Techniques Applied to a Falling Liquid Film", (Jun. 1976).
Kishii, T. et al., "A Focused-Beam Type Laser Interferometric Dilatometer," Proc. ICO Conf. Opt. Methods in Sci. and Ind. Meas. Tokyo (1974).
Sargent, J. P., et al., "Interferometric Measurement of Thermal Expansion," Applied Optics, vol. 17, No. 5 (Mar. 1, 1978).
Cuchlinski Jr. William A.
Gutierrez Diego F. F.
Honeywell Inc.
Pajak Robert A.
LandOfFree
Method and apparatus for measuring coefficient of thermal expans does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for measuring coefficient of thermal expans, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for measuring coefficient of thermal expans will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1749987