Geometrical instruments – Gauge – With support for gauged article
Reexamination Certificate
2005-08-02
2005-08-02
Fulton, Christopher W. (Department: 2859)
Geometrical instruments
Gauge
With support for gauged article
C033S0010DD, C033S534000, C072S031100, C072S389500, C382S152000, C356S138000
Reexamination Certificate
active
06922903
ABSTRACT:
A method and device for determining the length (b) of at least one of two legs (13, 14), of a workpiece (12) bent toward each other at a bending angle (β) requires location of the workpiece (12) in a defined position. The position of the bending angle vertex (S) and the position of the end (E) of the leg (13, 14) to be measured are determined. Based on the position of the bending angle vertex (S) and of the end (E), the length (b) is calculated as the distance between the bending angle vertex (S) and the end (E). The measuring apparatus includes a system serving to determine the position of the bending angle vertex (S), a unit serving to determine the position of the end (E) and an evaluation unit which, based on the position of the bending angle vertex (S) and of the end (E), calculates the length (b) as the distance between the bending angle vertex (S) and the end (E).
REFERENCES:
patent: 3943632 (1976-03-01), Albertazzi
patent: 4660293 (1987-04-01), Kovacs
patent: 5046852 (1991-09-01), Hametner et al.
patent: 5099666 (1992-03-01), Sartorio et al.
patent: 5329597 (1994-07-01), Kouno et al.
patent: 5375340 (1994-12-01), Gerritsen
patent: 5483750 (1996-01-01), Ooenoki et al.
patent: 5531087 (1996-07-01), Kitabayashi et al.
patent: 5603236 (1997-02-01), Hongo
patent: 5661671 (1997-08-01), Ooenoki et al.
patent: 5799530 (1998-09-01), Nagasawa
patent: 5842366 (1998-12-01), Klingel et al.
patent: 5857366 (1999-01-01), Koyama
patent: 5899964 (1999-05-01), Ooenoki et al.
patent: 5980085 (1999-11-01), Uemura et al.
patent: 6035242 (2000-03-01), Uemura et al.
patent: 6163374 (2000-12-01), Otani et al.
patent: 6289598 (2001-09-01), Tanabe
patent: 6473537 (2002-10-01), Yamada
patent: 6480269 (2002-11-01), Brinkman et al.
patent: 6722181 (2004-04-01), Nagakura
patent: 6727986 (2004-04-01), Serruys
patent: 2001/0049953 (2001-12-01), Nagasawa
patent: 2365490 (2002-07-01), None
patent: 4312565 (1994-10-01), None
Cohen Amy R.
Fulton Christopher W.
Pepe & Hazard LLP
Trumpf Werkzeugmaschinen GmbH+Co. KG
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