Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-08-08
2006-08-08
Nguyen, Vinh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S715000
Reexamination Certificate
active
07088120
ABSTRACT:
A probe device including a cantilever. A probe is attached to the cantilever and is allocated to be opposed to a surface of a sample attached thereto. An apparatus is provided with the probe device, which is capable of carrying out measurement of the sample while switching at a predetermined period two operating modes, a tapping mode for measuring a surface structure of the sample while vibrating the cantilever and a point contact mode for measuring an electrical characteristic of the sample while bringing the probe into contact with the sample.
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Kawai Tomoji
Matsumoto Takuya
Naitoh Yasuhisa
Otsuka Yoicho
Kobert Russell M.
Nguyen Vinh
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Osaka University
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