Method and apparatus for measuring and compensating for...

Details Method and apparatus for measuring and compensating for... Method and apparatus for measuring and compensating for...

2011-02-01

2011-02-01

Nguyen, Hai L (Department: 2816)

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Synchronizing

C327S149000

Reexamination Certificate

active

07880518

ABSTRACT:
A method and circuit for static phase error measurement includes a reference clock delay chain having a selectable number of delay elements. A number of the delay elements are enabled in accordance with a select length signal to delay a reference clock signal. A feedback signal delay chain also has a selectable number of delay elements. A number of the delay elements are enabled in accordance with a select length signal to delay a feedback signal. A latch tests phase alignment between the delayed reference clock signal and the delayed feedback signal and outputs a measurement of static phase error.

REFERENCES:
patent: 7236028 (2007-06-01), Choi
patent: 7279946 (2007-10-01), Minzoni
patent: 7471130 (2008-12-01), Gomm et al.
patent: 7746134 (2010-06-01), Lu et al.

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