Method and apparatus for measuring and adjusting the duty...

Details Method and apparatus for measuring and adjusting the duty... Method and apparatus for measuring and adjusting the duty...

2007-05-29

2007-05-29

Raymond, Edward (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C708S103000

Reexamination Certificate

active

10970284

ABSTRACT:
An apparatus, a method, and a computer program are provided to measure the duty cycle of a clocking signal in a processor. Traditionally, variations in the duty cycles of clocks within microprocessors have been of considerable concern. By employing frequency dividers and AND gates, the duty cycles of clocks can be precisely measured and adjusted accordingly to account for variation that might occur. The measurements and adjustments, therefore, can improve the operation of a microprocessor or any other clocked semiconductor.

REFERENCES:
patent: 5948046 (1999-09-01), Hagberg

Affiliated with

Also associated with

Rating

Method and apparatus for measuring and adjusting the duty... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for measuring and adjusting the duty..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for measuring and adjusting the duty... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3818673