Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1992-03-16
1994-08-30
Willis, Davis L.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356401, G01B 1102
Patent
active
053432916
ABSTRACT:
A device for measuring an interval between two plate-like objects includes a light source for projecting a light toward the objects, a detector for detecting a position of incidence, upon a predetermined surface, of the light projected by the light source and deflected by the two objects, and a calculating portion for measuring the interval of the two objects on the basis of the detection by the detector.
REFERENCES:
patent: 4656347 (1987-04-01), Une et al.
patent: 4988197 (1991-01-01), Ishisashi et al.
Feldman et al., "Application of Zone Plates to Alignment in X-Ray Lithography," Optical Engineering, Mar.-Apr., 1983, vol. 22, No. 2, pg. 203-207.
Hasegawa Masanobu
Matsugu Masakazu
Niwa Yukichi
Nose Noriyuki
Ohwada Mitsutoshi
Canon Kabushiki Kaisha
Keesee La Charles
Willis Davis L.
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