Radiant energy – Photocells; circuits and apparatus – Interference pattern analysis
Patent
1988-10-17
1989-10-17
Nelms, David C.
Radiant energy
Photocells; circuits and apparatus
Interference pattern analysis
250560, 356376, 350509, G02B 2742
Patent
active
048749559
ABSTRACT:
A method and apparatus adapted to measure a three-dimensional curved surface shape quantitatively with high speed. A pattern of interference fringes on a surface of an object to be measured is picked up so that while moving a reference plane (or the object to be measured) in the direction of an optical axis, the resulting video signal is processed to form a composite image in which a value of each of picture elements is represented by a position of the reference plane (or a position of the object to be measured) at an instant that one of positions on the object surface corresponding to that picture element in the image attains a maximum brightness. Then, a three-dimensional curved surface shape of the object to be measured is measured on the basis of the composite image.
REFERENCES:
patent: 4668094 (1987-05-01), Matsumoto et al.
patent: 4744660 (1988-05-01), Noguchi et al.
patent: 4794550 (1988-12-01), Greivenkamp
"Fundamental Study of Application of Light to Measurement" (published by Society for Automatic Control of Measurement) pp. 171-172.
Inomata Masaichi
Komine Isamu
Uesugi Mitsuaki
Meller Michael N.
Nelms David C.
NKK Corporation
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