Method and apparatus for measuring a thickness of a...

Electricity: measuring and testing – Magnetic – With means to create magnetic field to test material

Reexamination Certificate

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C324S229000

Reexamination Certificate

active

11221059

ABSTRACT:
A method and apparatus are provided for measuring a thickness of a nonconductive coating disposed over portions of first and second conductive surfaces that intersect at an intersection angle. The apparatus is a thickness measurement gauge having an eddy current sensor. The thickness measurement gauge includes an eddy current sensor and electronic analyzer. The thickness gauge may be provided with a pressure enclosure. A method of calibrating a thickness measurement gauge and a calibration stand are also provided. The calibration stand has third and fourth conductive surfaces intersecting at the intersection angle. The conductivities of the third and fourth surfaces correspond to the conductivities of the first and second surfaces.

REFERENCES:
patent: 3861559 (1975-01-01), McCormick
patent: 4000459 (1976-12-01), Little
patent: 4373398 (1983-02-01), Ponczek
patent: 4722142 (1988-02-01), Schmidt
patent: RE35703 (1997-12-01), Koch et al.
patent: 5777469 (1998-07-01), Hockey et al.
patent: 5847562 (1998-12-01), Fulton et al.
patent: 6243661 (2001-06-01), Baldwin et al.
Kaman Instrumentation Operations. KDM-8200 Instruction Manual; Part No. 860059-001, Rev. F; Colorado Springs, CO, Copyright 2000.

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