Optics: measuring and testing – By polarized light examination – With birefringent element
Patent
1985-11-29
1987-10-06
Willis, Davis L.
Optics: measuring and testing
By polarized light examination
With birefringent element
G01B 902
Patent
active
046979271
ABSTRACT:
In a method of measuring the forming error of an object with a shape which is optically smooth and can be expressed mathematically, the reflected light from the object and the reflected light from a reference mirror are made to interfere to form an interference fringe, and the forming error is calculated from the potential distribution of the interference fringe. This calculation of the forming error is performed by calculating the phase distribution W(x,y) of a virtual object beam which is reflected from the measuring surface on the basis of the design values of the shape of the object to be measured when there is no forming error.
REFERENCES:
Balasubramanian et al, "A New Approach to High Precision Phase Measurement Interferometry", Proc. SPIE, vol. 230, pp. 180-190, 1980.
Akira Ono and J. C. Wyant, "Aspherical Mirror Testing Using a CGH with Small Errors", Applied Optics, vol. 24 (1985) 560.
T. Yatagai and T. Kanou, "Aspherical Surface Testing with Shearing Interferometer Using Fringe Scanning Detection Method", Optical Engineering, vol. 23 (1984) p. 357.
H. Bruning, et al "Digital Wavefront Measuring Interferometer for Testing Optical Surfaces and Lenses", Applied Optics, vol. 13 (1974) 2693.
Kabushiki Kaisha Toshiba
Koren Matthew W.
Willis Davis L.
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