Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reexamination Certificate
2006-08-08
2006-08-08
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
Reexamination Certificate
active
07088109
ABSTRACT:
A method and apparatus for characterizing a non-linear device stimulates the device with a repetitive digital signal and uses relative phase measurements made with a vector network analyzer to measure the device response to the digital stimulus.
REFERENCES:
patent: 5059915 (1991-10-01), Grace et al.
patent: 5089782 (1992-02-01), Pike et al.
patent: 5548538 (1996-08-01), Grace et al.
patent: 6163223 (2000-12-01), Kapetanic et al.
patent: 6529844 (2003-03-01), Kapetanic et al.
Bogdan Szafraniec, Agilent Technologies EPSG talk, Oct. 16, 2002, “Spectral Phase Measurements”, pp. 1-14.
Marc Vanden Bossche, Jan Verspecht, Bob Dildine, “Signal Description for the Large Signal Network Analyzer”, 6 pages, May 8, 2002.
“Spectral Phase Measurement Technique by Spinning Phasor Method”, Oct. 15, 2002, SpinningPhasor.nb.
Agilent Technologie,s Inc.
Bouscaren June L.
Deb Anjan
Teresinski John
LandOfFree
Method and apparatus for measuring a digital device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for measuring a digital device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for measuring a digital device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3638625