Method and apparatus for measuring a digital device

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...

Reexamination Certificate

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Reexamination Certificate

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07088109

ABSTRACT:
A method and apparatus for characterizing a non-linear device stimulates the device with a repetitive digital signal and uses relative phase measurements made with a vector network analyzer to measure the device response to the digital stimulus.

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patent: 6163223 (2000-12-01), Kapetanic et al.
patent: 6529844 (2003-03-01), Kapetanic et al.
Bogdan Szafraniec, Agilent Technologies EPSG talk, Oct. 16, 2002, “Spectral Phase Measurements”, pp. 1-14.
Marc Vanden Bossche, Jan Verspecht, Bob Dildine, “Signal Description for the Large Signal Network Analyzer”, 6 pages, May 8, 2002.
“Spectral Phase Measurement Technique by Spinning Phasor Method”, Oct. 15, 2002, SpinningPhasor.nb.

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