Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1986-06-02
1988-04-05
Willis, Davis L.
Optics: measuring and testing
By polarized light examination
With light attenuation
73 454, 73 52, 209524, 209529, 209587, 209597, 209598, 209928, 356240, G01B 1124
Patent
active
047355085
ABSTRACT:
A method for measuring a curvature of a reflective surface includes the steps of directing a pair of collimated light beams onto a substantially smooth portion of the reflective surface and measuring the separation of the light beam images reflected from the surface as a representation of the curvature of the surface. An apparatus utilizing this method includes a pair of lasers for producing respective collimated light beams, a laser mount arranged to direct the separate light beams from the lasers as substantially parallel light beams onto a substantially smooth portion of a reflective surface being measured to produce respective bright spots on the surface, receiving images of the bright spots onto a diffuse target surface, viewing these bright spot images with a sensor to produce a light intensity pattern encompassing the spots and calculating the separation of the bright spot images from the light intensity pattern as a measure of the curvature of the surface.
REFERENCES:
patent: 2446628 (1948-08-01), Brown
patent: 2524929 (1950-10-01), Razek
patent: 3131815 (1964-05-01), Mathias
patent: 3788750 (1974-01-01), Maltby, Jr. et al.
patent: 4165939 (1979-08-01), Woodrow et al.
Halista Mitchell J.
Honeywell Inc.
Koren Matthew W.
Medved Albin
Willis Davis L.
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