Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Reexamination Certificate
2007-08-07
2007-08-07
Rosenberger, Richard A. (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
Having predetermined light transmission regions
C356S632000, C250S22300B
Reexamination Certificate
active
11247107
ABSTRACT:
A method for measuring the wall thickness of plastic containers during a container manufacturing process includes providing a plastic container, the plastic container having a longitudinal axis and at least two side walls spaced radially from the longitudinal axis. The side walls are formed of a material that absorbs light energy in a predetermined molecular absorption band. Light energy is then directed from a source through the at least two side walls of the plastic container in a plane transverse to the longitudinal axis of the plastic container. A portion of the light energy that passes through the sidewalls of the plastic container is sensed, and a signal representing a thickness of the sidewalls of the plastic container is generated from the sensed portion of the light energy.
REFERENCES:
patent: 3439178 (1969-04-01), Rottmann
patent: 3456788 (1969-07-01), Stapf
patent: 3684089 (1972-08-01), McMeekin
patent: 3721501 (1973-03-01), Atkinson et al.
patent: 3827812 (1974-08-01), Heimann
patent: 3860818 (1975-01-01), Stalder et al.
patent: 3980890 (1976-09-01), Heckrodt et al.
patent: 4304995 (1981-12-01), Huttunen et al.
patent: 4486136 (1984-12-01), Howard
patent: 4510389 (1985-04-01), Fumoto
patent: 4694158 (1987-09-01), Leser
patent: 4720808 (1988-01-01), Repsch
patent: 4919534 (1990-04-01), Reed
patent: 4989970 (1991-02-01), Campbell et al.
patent: 5138178 (1992-08-01), Wong et al.
patent: 5141110 (1992-08-01), Trischan et al.
patent: 5291271 (1994-03-01), Juvinall et al.
patent: 5291422 (1994-03-01), Esztergar
patent: 5354984 (1994-10-01), Baldwin
patent: 5502559 (1996-03-01), Powell et al.
patent: 5585603 (1996-12-01), Vogeley, Jr.
patent: 5591462 (1997-01-01), Darling et al.
patent: 5966217 (1999-10-01), Roe et al.
patent: 6031221 (2000-02-01), Furnas
patent: 6142641 (2000-11-01), Cohen et al.
patent: 6155408 (2000-12-01), Heuft et al.
patent: 6211952 (2001-04-01), Weiland et al.
patent: 6424414 (2002-07-01), Weiland et al.
patent: 6618495 (2003-09-01), Furnas
patent: 6985221 (2006-01-01), Semersky et al.
patent: WO 01/65204 (2001-07-01), None
patent: WO 02/33349 (2002-04-01), None
Semersky Frank E.
Sturgill Dennis T.
Fraser Donald R.
Fraser Clemens Martin & Miller LLC
Petwall, LLC
Rosenberger Richard A.
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