Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1991-03-26
1992-10-06
Nguyen, Vinh
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324158R, 324 731, G01R 3126
Patent
active
051535033
ABSTRACT:
A method for measuring carrier lifetime of IV group semiconductors. The method includes the steps of irradiating pulse light, whose photon energy is larger than the bandgap of a IV group semiconductor and whose interval is sufficiently longer than the carrier lifetime of a IV group semiconductor, on a IV group semiconductor to be measured, exciting the IV group semiconductor, and generating excess carriers, obtaining a decay time of a band emission from a IV group semiconductor, and determining a carrier lifetime of the IV group semiconductor from the decay time of the band emission.
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Kabushiki Kaisha Toshiba
Nguyen Vinh
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