Method and apparatus for measurement of surface temperature

Measuring and testing – Gas analysis – Moisture content or vapor pressure

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

356 43, 356118, G01J 506, G01N 2140

Patent

active

040206955

ABSTRACT:
The temperature of a metal surface is measured by positioning a radiation detector so that the angle between its optical axis and a line normal to the surface is equal to the principal angle of incidence of the radiation emitted by the surface and interposing a polarizer between surface and radiation detector adjusted to pass only radiation polarized parallel to the plane of emittance. In this way the effects of emissivity variations of the surface are greatly reduced.

REFERENCES:
patent: 3422678 (1969-01-01), Murray
patent: 3462224 (1969-08-01), Woods et al.
patent: 3791635 (1974-02-01), Schwestka

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for measurement of surface temperature does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for measurement of surface temperature, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for measurement of surface temperature will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-338873

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.