Method and apparatus for measurement of surface temperature

Details Method and apparatus for measurement of surface temperature Method and apparatus for measurement of surface temperature

1976-01-07

1977-05-03

Queisser, Richard C.

Measuring and testing

Gas analysis

Moisture content or vapor pressure

356 43, 356118, G01J 506, G01N 2140

Patent

active

040206955

ABSTRACT:
The temperature of a metal surface is measured by positioning a radiation detector so that the angle between its optical axis and a line normal to the surface is equal to the principal angle of incidence of the radiation emitted by the surface and interposing a polarizer between surface and radiation detector adjusted to pass only radiation polarized parallel to the plane of emittance. In this way the effects of emissivity variations of the surface are greatly reduced.

REFERENCES:
patent: 3422678 (1969-01-01), Murray
patent: 3462224 (1969-08-01), Woods et al.
patent: 3791635 (1974-02-01), Schwestka

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