Method and apparatus for measurement of reflectivity for high qu

Details Method and apparatus for measurement of reflectivity for high qu Method and apparatus for measurement of reflectivity for high qu

1992-05-07

1994-05-17

Housel, James C.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356445, 356448, G01N 2155

Patent

active

053132700

ABSTRACT:
An apparatus and methods are suggested for measuring reflectivity R of highly reflecting coatings, and, in particular, of very high reflectivity {(1-R)<0.001} mirrors based on the simultaneous measurement of power reflected from and transmitted through an optical cavity bounded by a mirror of unknown reflectivity and a reference mirror of predetermined reflectivity. To confirm the obtained results the reference mirror is replaced by another mirror of unknown reflectivity manufactured together with the first examined mirror in the same coating run.

REFERENCES:
patent: 3679313 (1972-07-01), Rosenberg
patent: 4436426 (1984-03-01), Smith
patent: 4448486 (1984-05-01), Evans
patent: 4571085 (1986-02-01), Anderson
patent: 4624573 (1986-11-01), Rahn et al.
patent: 4659224 (1987-04-01), Monchalin
patent: 4793709 (1988-12-01), Jabr et al.
patent: 5080491 (1992-01-01), Monchalin et al.
A. E. Seigman, Lasers, 1986, pp. 413-440.
N. A. Vinokurov et al, Method for measuring reflection coefficients close to unity (1985).

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