Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-09-02
2008-09-02
Nghiem, Michael P (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S065000, C702S075000
Reexamination Certificate
active
11536723
ABSTRACT:
A method and apparatus for a high frequency resistance measurement instrument with a reasonable dynamic range, which militates against saturation in the presence of one or more large undesirable signals, the high frequency measurement instrument capable of employing multiple alternating currents of differing frequencies to maintain measurement capability despite signal chain saturation in the presence of a large undesirable signal.
REFERENCES:
patent: 6794844 (2004-09-01), Hochgraf et al.
patent: 6816797 (2004-11-01), Freeman et al.
patent: 6849352 (2005-02-01), Formanski et al.
Foley Robert S.
Hochgraf Clark G.
Kaye Kenneth L.
Rea David
Zawisa Michael F.
GM Global Technology Operations Inc.
Nghiem Michael P
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