Method and apparatus for mapping test signals of an integrated c

Details Method and apparatus for mapping test signals of an integrated c Method and apparatus for mapping test signals of an integrated c

1993-01-28

1994-11-29

Beausoliel, Jr., Robert W.

Excavating

371 221, G01R 3128, G06F 1100, H04B 1700

Patent

active

053696433

ABSTRACT:
In an integrated circuit comprising discrete circuit modules, dedicated test signals for the individual circuit modules are multiplexed with operational signals to the external pins of the integrated circuit. When not in a test mode, the external pins of the chip are coupled to the normal operational signals. When a test mode is commanded, certain external pins are coupled to test signals that are not otherwise available off-chip in accordance with the contents of a test register.

REFERENCES:
patent: 4752729 (1988-01-01), Jackson et al.
patent: 4905240 (1990-02-01), Kimoto
patent: 4926363 (1990-05-01), Nix
patent: 5030904 (1991-07-01), Tanksalvala et al.

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