Method and apparatus for manufacturing a test-compatible, largel

Boots – shoes – and leggings

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

364578, 371 23, 371 36, G06F 1116

Patent

active

049512200

ABSTRACT:
A method and apparatus for the production of a test-compatible, largely defect-tolerant configuration of redundantly implemented, systolic VLSI systems. The method and apparatus for the configuration of redundantly implemented, systolic VLSI systems meets the conditions of defect-tolerance, test-compatibility and minimum hardware requirement. For this purpose, every module of the multi-dimensional systolic VLSI system has control logic allocated to it which controls A, B and C switches for the appertaining module. It is possible with the use of these switches to bridge a maximum of up to two faulty modules per row and one faulty module per column. A configuration algorithm provides a determination as to whether the established VLSI system is in the position to be able to execute the desired arithmetic operations.

REFERENCES:
patent: 3961250 (1976-06-01), Snethen
patent: 4527249 (1985-07-01), Van Brunt
patent: 4583224 (1986-04-01), Ishii et al.
patent: 4654851 (1987-03-01), Busby
patent: 4719626 (1988-01-01), Ogasawara
patent: 4744084 (1988-05-01), Beck et al.
patent: 4747102 (1988-05-01), Funatsu
patent: 4763289 (1988-08-01), Barzilai et al.
patent: 4769817 (1988-09-01), Krohn et al.
patent: 4782440 (1988-11-01), Nomizu et al.
patent: 4817094 (1989-03-01), Lebizay et al.
"Wafer-Scale Integration-A-Fault-Tolerant Procedure", IEEE Journal of Solid State Circuits, vol. SC 13, No. 3, Jun., 1978, by Aubusson et al.
"Reconfigurable Architectures for VLSI Processing Arrays", Proceedings of the IEEE, vol. 74, No. 5, May 1986, by Sami et al.
"On the Design of Easily Testable & Reconfigurable VLSI Processor Arrays", Workshop on Designing for Yield, Oxford, 1982.
"A Cost Oriented Redundancy Model for Defect-Tolerant VLSI/WSI Systems", Adam Hilger, Jan., 1988, by Ramacher.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for manufacturing a test-compatible, largel does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for manufacturing a test-compatible, largel, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for manufacturing a test-compatible, largel will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1683635

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.