Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Having air-gap dielectric
Reexamination Certificate
2011-05-24
2011-05-24
Smith, Matthew S (Department: 2823)
Semiconductor device manufacturing: process
Formation of electrically isolated lateral semiconductive...
Having air-gap dielectric
C257S276000, C257S522000, C257SE21564, C257SE21573, C257SE23013, C438S319000, C438S411000, C438S421000, C438S619000
Reexamination Certificate
active
07947566
ABSTRACT:
A semiconductor processing method includes providing a substrate, forming a plurality of semiconductor layers in the substrate, each of the semiconductor layers being distinct and selected from different groups of semiconductor element types. The semiconductor layers include a first, second, and third semiconductor layers. The method further includes forming a plurality of lateral void gap isolation regions for isolating portions of each of the semiconductor layers from portions of the other semiconductor layers.
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Chen Howard Hao
Hsu Louis Lu-Chen
Mandelman Jack Allan
F. Chau & Associates LLC
International Business Machines - Corporation
Kim Su C
Smith Matthew S
Verminski, Esq. Brian P.
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