Wells – Processes – With indicating – testing – measuring or locating
Reexamination Certificate
2008-04-29
2008-04-29
Chilcot, Jr., Richard E. (Department: 3635)
Wells
Processes
With indicating, testing, measuring or locating
C166S066000, C166S057000, C073S152540, C257S686000
Reexamination Certificate
active
10702836
ABSTRACT:
Methods and systems for operating integrated circuits at temperatures higher than expected ambient temperatures. The heating may be of entire circuit boards, portions of the circuit boards (such as the components within a multiple-chip module) and/or single devices. Methods and related systems may be used in any high temperature environment such as downhole logging tools, and the devices so heated are preferably of silicon on insulator semiconductor technology.
REFERENCES:
patent: 4391846 (1983-07-01), Raymond
patent: 5523619 (1996-06-01), McAllister et al.
patent: 5720342 (1998-02-01), Owens et al.
patent: 6263730 (2001-07-01), Grande et al.
patent: 6499545 (2002-12-01), MacGugan
patent: 6614718 (2003-09-01), Cecconi et al.
patent: 7017662 (2006-03-01), Schultz et al.
patent: 2002/0125966 (2002-09-01), Gunawardana et al.
John R. Vig, “Quartz Crystal Resonators and Oscillators For Frequency Control and Timing Applications, a Tutorial,” Chapters 2, 6 and 8; Jan. 2001.
Pending U.S. Appl. No. 10/702,836.
Masino James E.
Rodney Paul F.
Schultz Roger L.
Chilcot Jr. Richard E.
Halliburton Energy Service,s Inc.
Scott Mark E.
Smith Matthew J
LandOfFree
Method and apparatus for maintaining a multi-chip module at... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for maintaining a multi-chip module at..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for maintaining a multi-chip module at... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3922645