Method and apparatus for magnetic force control of a scanning pr

Measuring and testing – Surface and cutting edge testing – Roughness

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

G01B 528

Patent

active

056707126

ABSTRACT:
A method and apparatus of magnetic force control for a scanning probe, wherein a first magnetic source having a magnetic moment is provided on the scanning probe and a second magnetic source is disposed external to the scanning probe to apply a magnetic field in a direction other than parallel, and preferably perpendicular, to the orientation of the magnetic moment, from the second magnetic source to the first magnetic source to produce a torque related to the amplitude of the applied magnetic field acting on the probe. By controlling the amplitude of the applied magnetic field, the deflection of the scanning probe is maintained constant during scanning by the scanning probe. An output signal related to the amplitude of the magnetic field applied by the second magnetic source is produced and is indicative of a surface force applied to the probe. The invention can also be used to apply large forces during scanning for applications such as nanolithography or elasticity mapping.

REFERENCES:
patent: 4883959 (1989-11-01), Hosoki et al.
patent: 5461907 (1995-10-01), Tench et al.
patent: 5465046 (1995-11-01), Campbell et al.
patent: 5468954 (1995-11-01), Tohda et al.
patent: 5513518 (1996-05-01), Lindsay
patent: 5515719 (1996-05-01), Lindsay
"Scanning tunneling microscopy and atomic force microscopy studies of biomaterials at a liquid-solid interface.", S.M. Lindsay et al., J Vac. Sci. Technol. A I 1 (4), Jul./Aug. 1993, pp. 808-815.
"Atomic force microscope with magnetic force modulation." E.L.Florin et al., Rev. Sci. Instrum., 65(3), Mar. 1994, pp. 639-643.
"Force microscopy imaging in liquids using ae techniques.", M.A. Lantz et al., V/ Appl. Phys. Lett. 65(4), Jul. 1994, pp. 409-4 1.
"Imaging viscoelasticity by force modulation with the atomic force microscope.", M.Radmacher et al., Biophys. J., vol. 64, Mar. 1993, pp. 735-742.
"A new force controlled atomic force microscope for use in ultrahigh vacuum.", S.P. Jarvis et al. Rev. Sci. Instrum., 67(6), Jun. 1996, pp. 2281-2285.
"Force feedback surface force apparatus: Principles of operation", A.M. Stewart and J.L. Parker. Rev. Sci. Instrum., 63(12), Dec. 1992.
"Optimal control of force microscope cantilevers, H. Magnetic coupling implementation" K.J.Bruland, J.L. Garbini, W..M.Dougherty, J.A.Sidles. J.Appl. Phys. 80, pp. 1959-1964 Aug. 1996.
"A novel force microscope and point contact probe", Jarvis et al., Rev. Sci. Instrum. 64 (12), Dec. 1993, pp. 3515-3520.
"A new force sensor incorporating force-feedback control for interfacial force microscopy", Joyce et al., Rev. Sci. Instrum, vol. 62, No. 3, Mar. 1991.
"A rocking beam electrostatic balance for the measurement of small forces", Grigg, Rev. Sci. Instrum. 62 (3), Mar. 1991.
"Rocking-beam force-balance approach to atomic force microscopy", Grigg et al., Ultramicroscopy 42-44 (1992) 1504-1508.
"Regulation of a microcantilever response by force feedback", Mertz et al., Appl. Phys. Lett. 62 (19), 10 May 1993, pp. 2344-2346.
"Direct Measurement of the Short-Range Interaction between a Tungsten Tip and a Mica Surface", Gauthier-Manuel, Europhysics Letters, 17(8), pp. 195-200, 14 Jan. 1992.
"Surface force measurements on picometer and piconewton scales", Bryant et al., J. Vac. Sci. Technol. A8(4), Jul./Aug. 1990, pp. 3502-3505.
"Use of magnetic forces to control distance in a surface force apparatus", Stewart et al., Meas. Sci. Technol. 1 (1990) 1301-1303, Printed in the UK.
"Mechanical Parametric Amplification and Thermomechanical Noise Squeezing", Rugar et al., Physical Review Letters, vol. 67, No. 6, pp. 699-702.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for magnetic force control of a scanning pr does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for magnetic force control of a scanning pr, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for magnetic force control of a scanning pr will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1939285

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.