Method and apparatus for location and inspecting a two-dimension

Details Method and apparatus for location and inspecting a two-dimension Method and apparatus for location and inspecting a two-dimension

1997-03-13

2000-06-20

Boudreau, Leo H.

Image analysis

Image transformation or preprocessing

Measuring image properties

382190, G06K 936

Patent

active

060787007

ABSTRACT:
A method and apparatus optimizes the process of locating an image of a part by exploiting at least one set of regular co-linear features in the image of the part. A selected one of the at least one set of regular co-linear features is used to quickly correlate a set of image points and a set of model points which are likely to correspond to each other. A one to one correspondence of a subset of model points to a subset of image points yields a single possible location for the part in the image, which location can be quickly and reliably checked for correctness, and if incorrect, a next possible set to set correspondence can be tested until the correct location is found.

REFERENCES:
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patent: 5694482 (1997-12-01), Maali et al.
D.W. Jacobs, The Use of Grouping in Visual Object Recognition, MIT Artificial Intelligence Laboratory, Office of Naval Research, pp. 1-162, Oct. 1988.
D.G. Lowe, Object Recognition by Computer: The Role of Geometric Constraints, The MIT Press, pp. 449-454, 1990.
F. Groen, et al., Symbol Recognition in Electrical diagrams using probabilistic Graph Matching, Elsevier Science Publishers, pp. 343 and 349, 1985.
J. Cooper, et al., Early Jump-Out Corner Detectors, Transactions on Pattern Analysis and Machine Intelligence, vol. 15, No. 8, Aug. 1993.

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