Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1994-12-07
1996-10-29
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
356399, 228105, 348 95, G01B 1114, H01S 302
Patent
active
055701841
ABSTRACT:
An apparatus and method are provided to energize an optoelectric component, such as a semiconductor laser chip, exciting a lasing gap to emit light from the front facet of the chip. The laser is positioned on a transparent tool element having a conductive portion thereon. The conductive portion is preferably a metallized ITO surface transparent to visible light. This allows the laser to be energized while simultaneously looking through the tool element to image a feature on the laser. The lasing gap is then located with a high degree of precision with respect to this feature. This precise location information is used to position and bond the laser chip with respect to an optical transmission line with precise alignment.
REFERENCES:
patent: 4803871 (1989-02-01), Harada et al.
patent: 4832251 (1989-05-01), Hawrylo
patent: 4899921 (1990-02-01), Bendat et al.
Armington Richard S.
L'Esperance Leroy D.
Lucent Technologies - Inc.
Pham Hoa Q.
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