Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Patent
1990-06-08
1992-09-08
Wieder, Kenneth A.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
For fault location
324514, 324520, 324532, 324544, G01R 3111
Patent
active
051461706
ABSTRACT:
A method and apparatus for locating an abnormality in a gas-insulated electric device, operative to locate the spot of an insulation abnormality, which emerges inside a metallic container, from outside of said metallic container. A plurality of detectors (S.sub.0 -S.sub.n) disposed at certain positions in the metallic container produce detected signals, from which spectrum strengths (YH) in a high frequency band of 500 MHz or above are evaluated, and a position which renders a maximum spectrum strength is calculated from the relation between the spectrum strengths and the installation positions of the detectors and is determined to be the spot (x) of partial discharge.
REFERENCES:
patent: 3370022 (1968-02-01), Bader et al.
patent: 3430136 (1969-02-01), Brustle et al.
patent: 3869665 (1975-03-01), Kenmochi et al.
patent: 4385271 (1983-05-01), Kurtz et al.
patent: 4446402 (1984-05-01), Drouet
patent: 4882682 (1989-11-01), Takasuka et al.
patent: 4975800 (1990-12-01), Oshita et al.
Lightle et al., Sixth International Symposium on High Voltage Engineering, "Monitoring of GIS at Ultra High Frequency", (Aug. 1989).
Endo Fumihiro
Ishikawa Toshio
Iwaasa Shuzuo
Utsumi Tomoaki
Brown Glenn W.
Hitachi , Ltd.
Wieder Kenneth A.
LandOfFree
Method and apparatus for locating an abnormality in a gas-insula does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for locating an abnormality in a gas-insula, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for locating an abnormality in a gas-insula will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-136574