Method and apparatus for locally deriving test signals from prev

Details Method and apparatus for locally deriving test signals from prev Method and apparatus for locally deriving test signals from prev

1991-03-08

1993-04-27

Atkinson, Charles E.

Excavating

371 221, G01R 3128

Patent

active

052068625

ABSTRACT:
An IC has local test circuitry including a test point array, instruction register, data register, probe line drivers and control/sense line drivers/receivers. To test the IC, the instruction register is loaded initiating the test circuitry to address select test points to receive control signals and to address other select test points at which response signals are to be sensed. Control signals are produced from the data register contents. The data register contents are derived as a function of the prior contents of the data register and a bit pattern formed from response signals of select test points. According to one embodiment, the prior contents are exclusively or'ed with the bit pattern of response signals to derive the new data register contents. A continuous test is performed by using prior response signals exclusively OR'ed to data register contents so as to generate subsequent control signals. Predesigned test sequences enable fast continuous testing of the IC.

REFERENCES:
patent: 3795859 (1974-03-01), Benante et al.
patent: 3806891 (1974-04-01), Eichelberger et al.
patent: 4293919 (1981-10-01), Dasgupta et al.
patent: 4513418 (1985-04-01), Bardell, Jr. et al.
patent: 4517672 (1985-05-01), Pfleiderer et al.
patent: 4613970 (1986-09-01), Masuda et al.
patent: 4749947 (1988-06-01), Gheewala
patent: 4779273 (1988-10-01), Beucler et al.
patent: 4791356 (1988-12-01), Warren et al.
patent: 4903267 (1990-02-01), Arai et al.
"Design for Testability--A Survey", by T. W. Williams, et al., Proceedings IEEE, vol. 71, pp. 359-416, Jan., 1983.
"A Logic Design Structure for LSI Testability", Eichelberger, et al., Proceedings 14th Design Automation Conf., Jun., 1977.
"Built-in Self-Test Techniques" by E. J. McClusky, IEEE Design and Test, vol. 2, No. 2, pp. 21-28.
"Built-in Self-Test Structures" by E. J. McClusky, IEEE Design and Test, vol. 2, No. 2, pp. 29-36.
"Voltage Checking Device" by G. Canard and A. Potocki, IBM Technical Disclosure Bulletin, vol. 8, No. 5, Oct. 1965.

Affiliated with

Also associated with

Rating

Method and apparatus for locally deriving test signals from prev does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for locally deriving test signals from prev, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for locally deriving test signals from prev will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2333410