Method and apparatus for localizing weak points within an electr

Details Method and apparatus for localizing weak points within an electr Method and apparatus for localizing weak points within an electr

1985-07-22

1987-02-03

Frankfort, Charles

Thermal measuring and testing

Thermal testing of a nonthermal quantity

Of susceptibility to thermally induced deteriouration, flaw,...

374161, 374 5, 324158R, 324 73R, 250310, G01R 3100

Patent

active

046406263

ABSTRACT:
A method and apparatus localize weak points within an electrical circuit. The electrical circuit is covered with a liquid crystal and is heated to a temperature just below the clearing point of the liquid crystal. The liquid crystal converts into its unordered condition given a temperature increase and leakage channel within the integrated circuit are completely localized. By irradiating a three-dimensional region, at least one current is induced in the region by generating electron-hole pairs within the electrical circuit, this at least one current causing a temperature increase at at least one weak point of the electrical circuit.

REFERENCES:
patent: 3396335 (1968-08-01), Burr et al.
patent: 3549999 (1970-12-01), Norton
patent: 3678384 (1972-07-01), Oatley
patent: 3889053 (1975-06-01), Lloyd et al.
patent: 3934199 (1976-01-01), Channin
patent: 4215562 (1980-08-01), Gavrilin et al.
patent: 4242635 (1980-12-01), Burns
patent: 4287473 (1981-09-01), Sawyer
patent: 4355278 (1982-10-01), Burns et al.
patent: 4407008 (1983-09-01), Schmidt et al.
patent: 4431967 (1984-02-01), Nishioka
patent: 4466746 (1984-08-01), Hancock et al.
Sawyer, D. E. et al., "Thermal Mapping of Transistors with a Laser Scanner", Proceedings of the IEEE, Nov. 1976, pp. 1634-1635.
Sawyer, D. E. et al., "Laser Scanning of Active Integrated Circuits and Discrete Semiconductor Devices", Solid State Technology, Jun. 1977, pp. 37-41 and 48.

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