Image analysis – Pattern recognition – Template matching
Reexamination Certificate
2006-07-11
2006-07-11
Bali, Vikkram (Department: 2623)
Image analysis
Pattern recognition
Template matching
C382S141000, C382S209000, C348S129000
Reexamination Certificate
active
07076101
ABSTRACT:
A method and apparatus are disclosed for testing the accuracy of digital test images by comparing the value of each test image pixel with the average value of a corresponding reference image pixel array. The local image quantification verification test program accepts absolute differences between corresponding pixel and array values that are less than a specified difference maximum. The user may specify a difference maximum and a maximum array size, and may restrict the test image comparison to specified regions of the test image with specific difference tolerances for each region. This allows the user to focus the comparison on certain regions as more important than others and to focus a region on a particular object or group of objects.
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Chung Tat Leung
Hsieh The-Ming
Huang Shuangying
Hwang Lie-Hwang
Bali Vikkram
Hood Jeffrey C.
Meyertons Hood Kivlin Kowert & Goetzel P.C.
Sun Microsystems Inc.
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