Method and apparatus for jitter measurement using phase and...

Details Method and apparatus for jitter measurement using phase and... Method and apparatus for jitter measurement using phase and...

2003-09-05

2008-03-04

Vo, Don N. (Department: 2611)

Pulse or digital communications

Testing

Data rate

Reexamination Certificate

active

07339984

ABSTRACT:
An apparatus and method for measuring jitter using phase and amplitude undersampling. A sampling circuit samples an input signal to obtain amplitude and phase information, a computation circuit determines Time Interval Error (TIE) information from the amplitude and phase information, and a signal processor processes the TIE information to generate a jitter spectrum.

REFERENCES:
patent: 4751468 (1988-06-01), Agoston
patent: 4812769 (1989-03-01), Agoston
patent: 5291074 (1994-03-01), Nayebi
patent: 5557196 (1996-09-01), Ujiie
patent: 5692009 (1997-11-01), Iijima
patent: 5748672 (1998-05-01), Smith et al.
patent: 6369659 (2002-04-01), Delzer et al.
patent: 6522122 (2003-02-01), Watanabe et al.
patent: 6529842 (2003-03-01), Williams et al.
patent: 2003/0004664 (2003-01-01), Ward et al.
Seat, S., and Tality, “An Eye-Opening Look at Jitter,” [online], pp. 75-76 (Oct. 17, 2002). Retrieved from the Internet: www.edn.com.
“Frequency Agile Jitter Measurement System,” Application Note 1267, pp. 1-16, brochure from Agilent Technologies, printed Mar. 22, 2002.

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