Excavating
Patent
1986-09-02
1988-02-23
Fleming, Michael R.
Excavating
371 25, 364578, G06F 1100
Patent
active
047275456
ABSTRACT:
The method and apparatus for isolating faults in circuitry of a digital computer includes the use of a fault isolation generation program which provides a data base containing a list of possible faulty components for each cycle of the computer's clock for execution by a service processor of the actual computer during testing. The fault isolation generation program is generated by using a simulator loaded with a mathematical model of the actual computer in connection with the execution of the diagnostic program executed on the actual computer during testing. The fault isolation program generates a list of circuit elements capable of generating fault indications, excluding circuit elements not capable of generating such fault indications.
REFERENCES:
patent: 4342093 (1982-07-01), Miyoshi
patent: 4587625 (1986-05-01), Marino
patent: 4601032 (1986-07-01), Robinson
patent: 4644487 (1987-02-01), Smith
patent: 4654851 (1987-03-01), Busby
patent: 4669083 (1987-05-01), Lavison
"A Fault Detection and Isolation Technique for Microcomputers", Paper 9.5, IEEE Test Conference, Fasang, 1982.
"Incomplete Scan Path with an Automatic Test Generation Methodology" Paper 7.1, IEEE Test Conference, Konemann et al. 1979.
"Built-In Logic Block Observation Techniques", IEEE Test Conference, Konemann et al., 1979.
"Analysis and Simulation of Parallel Signature Analyzers", Paper 22.3, IEEE Test Conference, Sridhar et al., 1982.
"Self-testing by Polynomial Division", Journal of Digital Systems, vol. 6, No. 2/3, Bhavsar et al., Summer/Fall, 1982.
"Built-In Tests for VLSI Finite-State Machines", Digest of Papers, The Fourteenth International Conference on Fault-Tolerant Computing Hua et al., Jun. 20, 1984.
"Random Pattern Testability", IEEE Transaction on Computers, vol. C-33, No. 1, Reilly et al., Jan. 1982.
"Processor Controller for the IBM 3081", IBM Journal of Recent Developments, vol. 26, No. 1, Reilly et al., Jan. 1982.
"4381'S Error-Detection Fault-Isolation Speeds Repairs", Computer Systems Equipment Design, Cordi, Nov. 1984.
"Testability and Maintainability with a New 6K Gate Array", VLSI Design, Resnick, Mar./Apr.
"A Function-independent Self-test for Large Programmable Logic Arrays", Integration, the VLSI Journal 1, Grassl et al., Feb., 1983.
Glackemeyer Richard E.
Page Calvin F.
Petty Robert C.
Digital Equipment Corporation
Fleming Michael R.
LandOfFree
Method and apparatus for isolating faults in a digital logic cir does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for isolating faults in a digital logic cir, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for isolating faults in a digital logic cir will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-606696