Electricity: measuring and testing – Determining nonelectric properties by measuring electric...
Patent
1995-08-07
1997-02-11
Wieder, Kenneth A.
Electricity: measuring and testing
Determining nonelectric properties by measuring electric...
324658, 250375, G01R 2726, G01N 2722
Patent
active
056024681
ABSTRACT:
An apparatus for determining the characteristics of a particular ionization chamber by measuring the capacitance of the chamber and using that capacitance to identify the particular type of chamber being used to measure the ionizing radiation.
REFERENCES:
patent: 5080765 (1992-01-01), Wang et al.
patent: 5095217 (1992-03-01), Attix
Brunton J. E.
Do Diep
Radcal Corporation
Wieder Kenneth A.
LandOfFree
Method and apparatus for ion chamber identification does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for ion chamber identification, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for ion chamber identification will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-344945