Method and apparatus for interturn and/or interlayer fault testi

Details Method and apparatus for interturn and/or interlayer fault testi Method and apparatus for interturn and/or interlayer fault testi

1990-02-01

1991-12-10

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324653, G01R 3106

Patent

active

050721860

ABSTRACT:
An electric coil to be tested for interturn and/or interlayer faults is coupled into a series resonant circuit. A measurement of the quality-factor (Q-factor) is carried out by measuring the overshoot voltage in circuit resonance. Through the selection of a suitable capacitance in the series resonant circuit, the resonant frequency can be placed in a range in which the quality-factor of the coil attains its maximum value. The coil to be tested is therefore a component of a series resonant circuit. The measuring system for determining the quality-factor of the coil is low capacitively coupled into the resonant circuit. Because the interturn resistance of the test coil must be measured in any event, since this value is also obtained during Q-factor measurement, the necessary operating and measuring periods can be optimized.

REFERENCES:
patent: 2759146 (1956-08-01), Heinz
patent: 3181803 (1965-05-01), Warburton et al.
patent: 3667034 (1972-05-01), Freeze
patent: 3855554 (1974-12-01), Muller

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