Method and apparatus for interim in-situ testing of an electroni

Details Method and apparatus for interim in-situ testing of an electroni Method and apparatus for interim in-situ testing of an electroni

1996-08-13

1997-06-17

Ramirez, Ellis B.

Boots, shoes, and leggings

364489, 371 251, 324527, 39518304, 39518309, G06F 1700, G06F 1100, G01R 3128

Patent

active

056403372

ABSTRACT:
A technique is described for testing the performance of a target electronic system ultimately employing an ASIC comprising a core cell and surrounding logic, using an inchoate (designed, but not yet fabricated) ASIC on an interim basis. In one embodiment, a Q-part, or qualification part, which is essentially a bond-out of the core cell, is used in conjunction with programmable logic devices configured to perform the function of the surrounding logic. The Q-part and programmable logic are interconnected on a pod, and plugged into an interim version of a target electronic system. In another embodiment, the Q-part is software-simulated and interconnected on the pod to programmable logic devices. The programmable logic devices may be programmed either on-pod or off-pod, and signals incident to the operation of the pod plugged into the interim electronic system can be monitored and controlled.

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