Method and apparatus for interconnect built-in self test...

Details Method and apparatus for interconnect built-in self test... Method and apparatus for interconnect built-in self test...

2005-06-14

2005-06-14

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S122000, C702S123000, C702S182000, C702S189000, C714S733000, C714S726000, C324S073100, C324S763010, C370S241000

Reexamination Certificate

active

06907377

ABSTRACT:
A method and apparatus for Interconnect Built-In Self-Test (IBIST) Based System Management Performance Tuning provides for measuring operating conditions of an interconnect, which is between a first device and a second device in a post-production system, at operating speed with a set of one or more test data and a first set of one or more operating parameters. Results of the measuring are stored and operating conditions of the interconnect with the set of test data and a second set of operating parameters are measured. The method and apparatus further provides for selecting either the first or second set of operating parameters based on the measuring of operating conditions to optimize operation of the post-production system.

REFERENCES:
patent: 6000051 (1999-12-01), Nadeau-Dostie et al.
patent: 6357026 (2002-03-01), Hoang et al.
patent: 6586921 (2003-07-01), Sunter
patent: 2002/0089335 (2002-07-01), Williams
patent: 2003/0080769 (2003-05-01), Chen et al.
patent: 2003/0103462 (2003-06-01), Smith
Burlacu et al., ‘Fault Compensation Control Method for Interconnected Voltage-Type Power Converters’, Jul. 1997, IEEE Article, pp. 561-566.
Pendurkar et al., Switching Activity Generation with Automated BIST Synthesis for Performance Testing of Interconects, Sep. 2001, IEEE Article, vol.:20, No: 9, pp. 1143-1158.

Affiliated with

Also associated with

Rating

Method and apparatus for interconnect built-in self test... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for interconnect built-in self test..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for interconnect built-in self test... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3481523