Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-08-28
2007-08-28
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010
Reexamination Certificate
active
11084947
ABSTRACT:
A functional block under test (FBUT), comprising mixed-signal or analog circuits, can be tested by a digital test machine (DTM). A DTM sources test vectors to, and expects to receive certain vectors back from, a DUT. The DUT is a single, physically contiguous, IC upon which is integrated the FBUT, a mixed-signal generate and capture unit (MSGC) and a control system. The test vectors can include computer programs for instructing the control system on how to perform mixed-signal or analog-domain tests of the FBUT using resources of the MSGC (such as DACs and ADCs). The test vectors can also include data that effects the operation of a parameterized test procedure, where the test procedure is part of the control system. The control system, in accordance with the test procedure, uses the MSGC to perform mixed-signal or analog-domain tests of the FBUT. The FBUT can include an analog test bus.
REFERENCES:
patent: 6202183 (2001-03-01), Ginetti et al.
patent: 7148676 (2006-12-01), Kamano et al.
patent: 2003/0154047 (2003-08-01), Chun et al.
Caffee Aaron Joseph
Jones Christopher Scott
Lefferts Robert Beverly
Segelken Ross Andrew
Sonntag Jeffrey Lee
Park Vaughan & Fleming LLP
Synopsys Inc.
Tang Minh N.
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