Method and apparatus for inspecting the quality of transparent p

Details Method and apparatus for inspecting the quality of transparent p Method and apparatus for inspecting the quality of transparent p

1997-09-19

1999-08-17

Kim, Robert H.

Optics: measuring and testing

Inspection of flaws or impurities

Having predetermined light transmission regions

356382, 356372, 356445, G01N 2100

Patent

active

059401737

ABSTRACT:
A method and apparatus for inspecting the quality of transparent protective overlays. The inspection method and apparatus enables accurate inspection of formed transparent protective overlays and enables implementation of more quantitative control of transparent protective overlay quality. Such method and apparatus automatically and accurately inspects the quality of transparent protective overlays placed on substrate surfaces to determine whether the transparent protective overlay formed to protect information such as images, text, or symbols recorded on the surface of a card-type or other easily portable information-recorded medium is of acceptable quality.

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