Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent
1983-11-23
1985-12-24
Kittle, John E.
Optics: measuring and testing
Inspection of flaws or impurities
Having predetermined light transmission regions
356239, 356241, G01N 2188
Patent
active
045602735
ABSTRACT:
In inspecting plated through holes in printed circuit boards, light from a light source is introduced into the light conducting substrate of the printed circuit boards having through holes. A light detector senses the light in the holes. The detected through holes are masked to prevent the light from entering the through hole of the substrate. A light detector senses light leaked to the hole. By signals supplied from the light detectors, the plated through holes can be continuously and efficiently inspected.
REFERENCES:
patent: 3698821 (1972-10-01), Ekstrand
patent: 4145714 (1979-03-01), MacDonald et al.
patent: 4302105 (1981-11-01), Sick
patent: 4447152 (1984-05-01), Rainford et al.
Ando Moritoshi
Kakinoki Yoshikazu
Mita Kikuo
Fujitsu Limited
Kittle John E.
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