Method and apparatus for inspecting flexible display medium...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07486101

ABSTRACT:
A method provides for inspecting flexible display medium layer, on which a driving electrode structure to be formed is not complete or there is no driving electrode structure. The flexible display medium layer passes an inspection area. Then, the inspected method is applied to inspect a performance of the flexible display medium layer on a corresponding region being passing the inspection area. The inspected results are recorded, in which the information for indicating a functional performance of the flexible display medium layer is recorded or shown according to a performance level. An apparatus can inspect the flexible display medium layer in accordance with the foregoing method.

REFERENCES:
patent: 5451427 (1995-09-01), Takahashi et al.
patent: 6329816 (2001-12-01), Suzuki et al.
patent: 6645614 (2003-11-01), Girt et al.
patent: 7181979 (2007-02-01), Lin et al.
patent: 7182976 (2007-02-01), Takahashi et al.
patent: 7236292 (2007-06-01), LeCain et al.
patent: 7365562 (2008-04-01), Jeon
patent: 2007/0296452 (2007-12-01), Kang et al.
patent: 04-198914 (1992-07-01), None
patent: 07-013116 (1995-01-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for inspecting flexible display medium... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for inspecting flexible display medium..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for inspecting flexible display medium... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4117965

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.