Method and apparatus for inspecting flat panel display

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

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Reexamination Certificate

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10669348

ABSTRACT:
A novel method and apparatus inspects liquid crystal display. The method and apparatus for inspecting the flat display device scans at least one signal wire by using a magnetic sensor and detects a resistance change of the magnetic sensor to perceive a short in the signal wire. Pixels can be tested using an array of magnetic sensors configured such that each sensor in the array is smaller than the pixel.

REFERENCES:
patent: 5073754 (1991-12-01), Henley
patent: 6545500 (2003-04-01), Field
patent: 6566902 (2003-05-01), Kwon et al.
patent: 2002/0075419 (2002-06-01), Kwon et al.
patent: 56-154678 (1981-11-01), None
patent: 63-285476 (1988-11-01), None
patent: 6-26987 (1994-02-01), None
patent: 08-015360 (1996-01-01), None
patent: 9-270544 (1997-10-01), None
patent: 10-222817 (1998-08-01), None
patent: 11-259820 (1999-09-01), None
patent: 2001-296507 (2001-10-01), None
patent: 2002-358609 (2002-12-01), None

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