Method and apparatus for inspecting components

Details Method and apparatus for inspecting components Method and apparatus for inspecting components

2011-08-09

2011-08-09

Chawan, Sheela (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C382S149000, C250S492200, C073S627000

Reexamination Certificate

active

07995829

ABSTRACT:
A method for inspecting a component is provided. The method includes generating an image of the component, generating a signal indication mask, and generating a noise mask using a signal within the signal indication mask. The noise mask facilitates reducing a quantity of prospective signals contained in the signal indication mask. The method further includes utilizing the signal indication mask and the generated noise mask to calculate the signal-to-noise ratio of at least one potential flaw indication that may be present in the image.

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