Method and apparatus for inspecting component placement and sold

Details Method and apparatus for inspecting component placement and sold Method and apparatus for inspecting component placement and sold

1998-03-19

1999-05-11

Pham, Hoa Q.

Optics: measuring and testing

By polarized light examination

With light attenuation

356394, 3562371, G01B11/00

Patent

active

059033533

ABSTRACT:
A manufacturing defect analyzer, for inspecting assembled printed circuit boards, including a light source, an optical receiver, a computer controller, and a memory. A plurality of key-points are specified for each component mounted to a printed circuit board. A data record characterizing each key-point is then stored in memory. Next, the defect analyzer measures the height of selected key-points relative to reference key-points for each component. Finally, the measured heights are compared with limit values, thereby determining whether each component is defectively attached to the printed circuit board. The data records facilitate inspection of printed circuit boards having components that are available in different package types.

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