Method and apparatus for inspecting and repairing liquid...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

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Reexamination Certificate

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07545162

ABSTRACT:
An apparatus of inspecting a liquid crystal display device includes a magnetic sensor scanning a signal line pattern on a substrate to detect a defective position of the signal line pattern, a camera imaging the signal line pattern detected by the magnetic sensor, an inspecting jig contacting a probe pin with the signal line pattern to determine the existence of defective in the signal line pattern, a transferring tool system transferring at least one of the substrate, the magnetic sensor and the camera in a two-axis direction, and a controller controlling the magnetic sensor, the camera, the inspecting jig and the transferring tool system.

REFERENCES:
patent: 5073754 (1991-12-01), Henley
patent: 5734158 (1998-03-01), Nagashima et al.
patent: 5740272 (1998-04-01), Shimada
patent: 6107806 (2000-08-01), Field
patent: 6429897 (2002-08-01), Derndinger et al.
patent: 6853364 (2005-02-01), Kai et al.
patent: 2003/0117164 (2003-06-01), Fujii et al.
patent: 2000055964 (2000-02-01), None

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