Image analysis – Histogram processing – For setting a threshold
Patent
1993-03-19
1994-12-27
Mancuso, Joseph
Image analysis
Histogram processing
For setting a threshold
348 92, 348131, G06K 900
Patent
active
053772784
ABSTRACT:
A solderless terminal inspecting method and apparatus for determining if a solderless terminal has been satisfactorily crimped against an electric conductor has a main illuminating device for illuminating a solderless terminal having illuminating elements extending in substantially the same direction as a length of a solderless terminal. The inspecting apparatus also includes an auxiliary illuminating device for illuminating a solderless terminal in a direction opposite to the illuminating direction of the main illuminating device. The apparatus also includes an illuminated image receiving device for receiving the illuminated image of the solderless terminal. The image of the solderless terminal received by the image receiving device is binary-coded by using at least one binary level determined according to an area histogram which has been obtained in advance, and an image processing device determines from the image whether the solderless terminal is correctly crimped to the electric conductor.
REFERENCES:
patent: 4421410 (1983-12-01), Karasaki
patent: 4555799 (1985-11-01), Kodama et al.
patent: 4563095 (1986-01-01), Puffer
patent: 4573073 (1986-02-01), Corby, Jr.
patent: 4649621 (1987-03-01), Dusel et al.
patent: 4734766 (1988-03-01), Shiozumi et al.
patent: 4760444 (1988-07-01), Nielson et al.
patent: 4922308 (1990-05-01), Noguchi et al.
patent: 4975863 (1990-12-01), Sistler et al.
patent: 4975972 (1990-12-01), Bose et al.
patent: 4988202 (1991-01-01), Nayar et al.
patent: 5010578 (1991-09-01), Siener et al.
patent: 5060290 (1991-10-01), Kelly et al.
patent: 5072127 (1991-12-01), Cochran et al.
patent: 5073952 (1991-12-01), Watanabe
patent: 5187611 (1993-02-01), White et al.
patent: 5204911 (1993-04-01), Schwartz et al.
patent: 5225891 (1993-07-01), Choumei
patent: 5235649 (1993-08-01), Reda
G. Odawar et al., "An Integrated Visual System for Solder Inspection," 9th International Converence on Pattern Recognition, 14-17 Nov. 1988, V. II. Computer Society Press.
DelRosso Gerard
Mancuso Joseph
Sumitomo Wiring Systems Ltd.
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