Image analysis – Applications – Manufacturing or product inspection
Patent
1997-07-03
2000-11-14
Couso, Jose L.
Image analysis
Applications
Manufacturing or product inspection
382145, 382147, 382155, G06K 900, G06K 962
Patent
active
061480991
ABSTRACT:
An incremental concurrent learning method starts with providing potential defects and fabrication information and a primary classification rule and secondary classification rule selection from a knowledge defect database from multiple products with different process cycles. The method then performs a truth inquiry to update a classification rule database for use by the primary classification rule and secondary classification rule selection. The method performs a primary defect classification and checks the confidence of the classification, and performs a secondary defect classification if the confidence is not high. If the confidence of the secondary defect classification is not high, a new defect may have been discovered and a novelty defect detection step is performed to define artifacts or potential new defect types to provide information for the truth inquiry.
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Kuan Chih-Chau L.
Lee Shih-Jong J.
Couso Jose L.
Dang Duy M.
Leone George A.
Moffa Emil
NeoPath, Inc.
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