Radiant energy – Electrically neutral molecular or atomic beam devices and...
Reexamination Certificate
2007-04-17
2007-04-17
Wells, Nikita (Department: 2881)
Radiant energy
Electrically neutral molecular or atomic beam devices and...
C250S309000, C250S425000, C250S288000
Reexamination Certificate
active
10531194
ABSTRACT:
The present invention relates to a method for modifying the electronic properties of a surface to analytical ends, such as SIMS or electron spectroscopy, characterised in that it comprises in situ deposition of pure neutral cesium (Cs0), under ultra-high vacuum, said neutral cesium being enabled in the form of a collimated adjustable stream. The invention relates also to the special column designed for implementing the method and to the corresponding energy and/or mass analyser instrument.
REFERENCES:
patent: 2972115 (1961-02-01), Zacharias et al.
patent: 1 315 647 (1973-05-01), None
T. Wirtz et al. “Useful Yields of MCs+and MCs2xclusters: a comparative study between the Cameca IMS 4f and the Cation Mass Spectometer” International Journal of Mass Spectrometry 209 (2001) p. 57-67.
Th. Mootz et al.“Cation Mass Spectrometer: an Instrument Dedicated to the Analysis of MCsx+Clusters. Description of the Instrument and Preliminary Results” Proceedings of the 12th International Conference on Secondary Ion Mass Spectrometry, Brussels, Belgium Sep. 5-11 1999 p. 233-236.
M. Kamaratos. “Adsorption kinetics of Cs-O activation layer on GaAs (1 0 0)” Applied Surface Science 185 (2001) p. 66-71.
Migeon Henri Noel
Wirtz Tom
Centre de Recherche Public-Gabriel Lippmann
Wells Nikita
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