Radiant energy – Ionic separation or analysis – With sample supply means
Reexamination Certificate
2007-08-21
2007-08-21
Vanore, David (Department: 2881)
Radiant energy
Ionic separation or analysis
With sample supply means
C250S281000, C250S282000
Reexamination Certificate
active
11315788
ABSTRACT:
In a mass spectrometer, ions from an ion source pass through an inlet aperture into a vacuum chamber for transmitting prior to mass analysis by the mass analyzer. The configuration of the inlet aperture forms a sonic orifice or sonic nozzle and with a predetermined vacuum chamber pressure, a supersonic free jet expansion is created in the vacuum chamber that entrains the ions within the barrel shock and Mach disc. Once formed, at least one ion guide with a predetermined cross-section to essentially radially confine the supersonic free jet expansion can focus the ions for transmission through the vacuum chamber. This effectively improves the ion transmission between the ion source and the mass analyzer.
REFERENCES:
patent: 4121099 (1978-10-01), French et al.
patent: 4542293 (1985-09-01), Fenn et al.
patent: 5298743 (1994-03-01), Kato
patent: 5652427 (1997-07-01), Whitehouse et al.
patent: 5973322 (1999-10-01), Rockwood
patent: 6011259 (2000-01-01), Whitehouse et al.
patent: 6107628 (2000-08-01), Smith et al.
patent: 6528784 (2003-03-01), Tang et al.
patent: WO98/52682 (1998-11-01), None
patent: WO02/097857 (2002-12-01), None
Ashkenas et al. “Experimental Methods in Rarefied Gas Dynamics”, Supersonic Free Jets—Structure and Utilization, pp. 84-105.
Campargue, Roger, “Aerodynamic Separation Effect on Gas and Isotope Mixtures Induced by Invasion of the Free Jet Shock Wave Structure”, The Journal of Chemical Physics, vol. 52, No. 4, Feb. 15, 1970, pp. 1795-1802.
Dodonov et al., “A New Technique for Decomposition of Selected Ions in Molecule Ion Reactor Coupled with Ortho-Time-of-flight Mass Spectrometry”, Rapid Communications in Mass Spectrometry, vol. 11., 1649-1656 (1997).
Douglas et al., “Gas Dynamics of the Inductively Cupled Plasma Mass Spectrometry Interface”, Journal of Analytical Atomic Spectrometry, Sep. 1988, vol. 3, pp. 743-747.
Fenn, John B., “Mass spectrometric implications of high-pressure ion sources”, International Journal of Mass Spectrometry 200 (2000) pp. 459-478.
PCT/US2006/000492 International Search Report mailed May 9, 2007.
Bondarenko, P.V. et al, “A new electrospray-ionization time-of-flight mass spectrometer with electrostatic wire ion guide”, International Journal of Mass Spectrometry and Ion Processes, Elsevier Scientific Publishing Co. Amsterdam, NL, vol. 160, No. 1, Jan. 1997, pp. 241-258.
Krutchinsky, A.N. et al, “Collisional Damping Interface for an Electrospray Ionization Time-of-Flight Mass Spectrometer”, Journal of the American Society for Mass Spectrometry, Elsevier Science Inc., US. vol. 9, No. 6, Jun. 1998, pp. 569-579.
Niessen, W.M.A., “Advances in instrumentation in liquid chromatography-mass spectrometry and related liquid-introduction techniques”, Journal of Chromatography A, Elsevier, Amsterdam, NL, vol. 794, No. 1-2, Jan. 23, 1998, pp. 407-435.
Tolmachev, A.V. et al, “Simulation-based optimization of the electrodynamic ion funnel for high sensitivity electrospray ionization mass spectrometry”, International Journal of Mass Spectrometry, Elsevier Science Publishers, Amsterdam NL, vol. 203, No. 1-3, Dec. 26, 2000, pp. 31-47.
Collings Bruce A.
Covey Thomas R.
Guna Mircea
Javaheri Hassan
Loboda Alexandre V.
Applera Corporation
Karnakis Andrew T.
MDS Inc.
Vanore David
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