Method and apparatus for implementing four-frequency measuring p

Details Method and apparatus for implementing four-frequency measuring p Method and apparatus for implementing four-frequency measuring p

1990-02-16

1991-09-10

Wieder, Kenneth

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Piezoelectric crystal testing

324652, 324649, G01R 2922

Patent

active

050477269

ABSTRACT:
A third case or manner of obtaining the four critical frequencies useful in accurately measuring coupled-dual resonator crystals, wherein both ports of the crystal structure are monitored, rather than a single port in the previously known cases. Here the B port, for example, is monitored with the A-side open-circuited or with a capacitor in parallel with it, and the A port is monitored with the B-side short-circuited.

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G. E. Roberts, Proc. 33rd Ann. Symp. on Freq. Contr., "A Four-Frequency Process for Accurately Measuring Coupled-Dual Resonator Crytal", May, 1979, pp. 159-165.
G. E. Roberts, IEEE Trans. on Ultrasonics, Ferroelectrics, & Freq. Control, "The Four-Frequency Process for Coupled Duals Using Error-Corrected S-Parameter Measurements", vol. 35, No. 3, May, 1988, pp. 306-314.

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