Optical: systems and elements – Deflection using a moving element
Reexamination Certificate
2005-08-09
2005-08-09
Phan, James (Department: 2872)
Optical: systems and elements
Deflection using a moving element
C359S202100, C359S371000, C359S900000, C356S369000
Reexamination Certificate
active
06927888
ABSTRACT:
The present invention provides a method and apparatus for improving the signal to noise ratio, the contrast and the resolution in images recorded using an optical imaging system which produces a spatially resolved image. The method is based on the incorporation of a polarimeter into the setup and polarization calculations to produce better images. After calculating the spatially resolved Mueller matrix of a sample, images for incident light with different states of polarization were reconstructed. In a shorter method, only a polarization generator is used and the first row of the Mueller matrix is calculated. In each method, both the best and the worst images were computed. In both reflection and transmission microscope and Macroscope and ophthalmoscope modes, the best images are better than any of the original images recorded. In contrast, the worst images are poorer. This technique is useful in different fields such as confocal microscopy, Macroscopy and retinal imaging.
REFERENCES:
patent: 6577394 (2003-06-01), Zavislan
J. B. Pawley (Editor), Handbook of Biological Confocal Microscopy, 2nded. Plenum, New York (1995), (no copy furnished).
A. C. Ribes, S. Damaskinos, A. E. Dixon, K. A. Kellis, S. P. Duttagupta, and P. M. Fauchet, Progress in Surface Science, 50, 295 (1995).
R. H. Webb, G. W. Hughes, and F. C. Delori, Appl. Opt. 26, 1492 (1987).
J. Liang, D. R. Williams, and D. T. Miller, J. Opt. Soc. Am. A 14, 2884 (1997).
I. Iglesias and P. Artal. Opt. Lett. 25, 1804 (2000).
K. Muth, M.C.W. Campbell, A. J. Roorda, and C. Cui, OSA Technical Digest Series 1, 56-59 (1997).
M. P. Rowe, E. N. Pugh, Jr., J. S. Tyo, and N. Engheta, Opt. Lett. 20, 608 (1995).
Y. Gang and L. V. Wang, Opt. Lett. 24, 537 (1999).
S. Jiao Y. Gang and L. V. Wang, Appl. Opt. 39, 6318 (2000).
A. W. Dreher, K. Reiter, and R. N. Weinred, Appl. Opt. 31, 3730 (1992).
W. G. Egan, W. R. Johnson, and V. S. Whitehead, Appl. Opt. 30, 435 (1991).
W. Mickols, I Tinoco, J. E. Katz, M. F. Maestre, and C. Bustamente, Rev. Sci. Instrum. 12, 2228 (1985).
R. A. Chipman, inHandbook of Optics, 2nd ed., M. Bass, ed. (McGraw-Hill, New York, 1995) Sec. 22.1.
J. M. Bueno and J. Jaronski, Opthal. Physiol. Opt. 21, 384 (2001).
J. M. Bueno and P. Artal, Opt. Lett. 24, 64 (1999).
H. G. Jerrard, J. Opt. Soc. Am. 44, 634 (1954).
J. W. Goodman, inLaser Speckle and Related Phenomena, 2nd ed., J.C. Dainty, ed., vol. 9 of Topics in Applied Physics (Springer-Verlag,1984), 9-75.
J. M. Bueno and P. Artal, J. Opt. Soc. Am A 18, 489 (2001).
B. Pelz, C. Weschenmoser, S. Goelz, J. P. Fischer, R. O. W. Burk, and J. F. Bille, Proc. SPIE 2930, 92 (1996).
Campbell Melanie C. W.
Garcia Juan Manuel Bueno
Hill & Schumacker
Phan James
Schumacher Lynn C.
LandOfFree
Method and apparatus for imaging using polarimetry and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for imaging using polarimetry and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for imaging using polarimetry and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3490234