Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2011-08-30
2011-08-30
Le, John H (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C438S014000, C702S081000
Reexamination Certificate
active
08010310
ABSTRACT:
A method includes performing burn-in testing of a device in a tester to generate post burn-in data. Pre-burn-in data associated with the device is compared to the post burn-in data. The device is identified as an outlier device based on the comparison.
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patent: 7340359 (2008-03-01), Erez et al.
patent: 7494829 (2009-02-01), Subramaniam et al.
Jason Allen Pharis “Outlier model using FMAX to predict failing devices”, Texas Tech University, Aug. 2005.
Ertle Benjamin
Ferno Paul A.
Routh James E.
Vijayaraghavan Rajesh
Advanced Micro Devices , Inc.
Le John H
Williams Morgan & Amerson P.C.
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