Method and apparatus for identifying lead-related conditions...

Surgery: light – thermal – and electrical application – Light – thermal – and electrical application – Electrical energy applicator

Reexamination Certificate

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C607S119000

Reexamination Certificate

active

07047083

ABSTRACT:
A method and apparatus for automatically detecting and diagnosing lead-related conditions is provided. Specifically, relatively short-term and relatively long-term impedance parameters are determined for detecting an impedance trend indicative of a lead-related condition such as an open circuit, which may be due to a conductor fracture or poor connection to an associated implantable medical device, or a short circuit due to an insulation breach. Monitoring of multiple lead impedance parameters is performed to diagnose a lead-related condition based on a number of diagnostic criteria. Supplementary analysis of multiple lead impedance parameter trends may be performed to identify lead-specific conditions, such as metal ion oxidation induced insulation degradation. A lead-related condition diagnosis and supporting data are stored in memory for uplinking to an external device for review by a clinician. A recommended corrective action and/or a patient notification signal for a lead-related condition may optionally be provided.

REFERENCES:
patent: 4140131 (1979-02-01), Dutcher et al.
patent: 4825869 (1989-05-01), Sasmor et al.
patent: 4899750 (1990-02-01), Ekwall
patent: 4944746 (1990-07-01), Iwata et al.
patent: 5003975 (1991-04-01), Hafelfinger et al.
patent: 5117824 (1992-06-01), Keimel et al.
patent: 5137021 (1992-08-01), Wayne et al.
patent: 5184614 (1993-02-01), Collins et al.
patent: 5201865 (1993-04-01), Kuehn
patent: 5215081 (1993-06-01), Ostroff
patent: 5224475 (1993-07-01), Berg et al.
patent: 5431692 (1995-07-01), Hansen et al.
patent: 5507746 (1996-04-01), Lin
patent: 5507786 (1996-04-01), Morgan et al.
patent: 5534018 (1996-07-01), Wahlstrand et al.
patent: 5549646 (1996-08-01), Katz et al.
patent: 5660183 (1997-08-01), Chiang et al.
patent: 5722997 (1998-03-01), Nedungadi et al.
patent: 5741311 (1998-04-01), Mc Venes et al.
patent: 5755742 (1998-05-01), Schuelke et al.
patent: 5814088 (1998-09-01), Paul et al.
patent: 5891179 (1999-04-01), Er et al.
patent: 5897577 (1999-04-01), Cinbis et al.
patent: 5944746 (1999-08-01), Kroll
patent: 6067473 (2000-05-01), Greeninger et al.
patent: 6129746 (2000-10-01), Levine et al.
patent: 6141585 (2000-10-01), Prutchi et al.
patent: 6317633 (2001-11-01), Jorgenson et al.
patent: 6721600 (2004-04-01), Jorgenson et al.
patent: 6760624 (2004-07-01), Anderson et al.
patent: 2001/0031997 (2001-10-01), Lee
patent: 2001/0037366 (2001-11-01), Webb et al.
patent: 2002/0120307 (2002-08-01), Jorgenson et al.
patent: 2004/0122487 (2004-06-01), Hatlestad et al.
patent: 0 715 866 (1996-12-01), None
patent: WO 02/18009 (2002-03-01), None

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